{"id":14423,"date":"2022-12-20T15:28:09","date_gmt":"2022-12-20T14:28:09","guid":{"rendered":"http:\/\/wordpress.p614908.webspaceconfig.de\/uncategorized\/design-for-testability"},"modified":"2023-02-28T10:47:29","modified_gmt":"2023-02-28T09:47:29","slug":"design-for-testability","status":"publish","type":"post","link":"https:\/\/www.melecs.com\/en\/design-for-testability","title":{"rendered":"Design for Testability"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-post\" data-elementor-id=\"14423\" class=\"elementor elementor-14423 elementor-10058\" data-elementor-post-type=\"post\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-7982ebf elementor-section-height-min-height elementor-section-items-bottom blue-banner elementor-section-boxed elementor-section-height-default\" data-id=\"7982ebf\" data-element_type=\"section\" data-e-type=\"section\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-7af32a0b\" data-id=\"7af32a0b\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-152cb95e elementor-widget elementor-widget-heading\" data-id=\"152cb95e\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h1 class=\"elementor-heading-title elementor-size-default\">Design for Testability<\/h1>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-3c18165e elementor-widget elementor-widget-breadcrumbs\" data-id=\"3c18165e\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"breadcrumbs.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<p id=\"breadcrumbs\"><span><span><a href=\"https:\/\/www.melecs.com\/en\">Home<\/a><\/span><\/span><\/p>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-309714b elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"309714b\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-no\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-32f1457\" data-id=\"32f1457\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-e6db925 elementor-widget elementor-widget-heading\" data-id=\"e6db925\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Design techniques to integrate testability features in a hardware product design. <\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-cb8f1c0 elementor-widget elementor-widget-text-editor\" data-id=\"cb8f1c0\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>The term <strong>Design for Testability (DFT)<\/strong> refers to design techniques that integrate testability features into a hardware product design.<\/p><p>The aim of the various test procedures is to rule out manufacturing defects and thus ensure the correct function and quality of the product. The test requirements are already defined in the development phase.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-41fb8d7 elementor-widget elementor-widget-image\" data-id=\"41fb8d7\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img fetchpriority=\"high\" decoding=\"async\" width=\"800\" height=\"533\" src=\"https:\/\/www.melecs.com\/wp-content\/uploads\/2022\/10\/testability-1024x682.webp\" class=\"attachment-large size-large wp-image-10064\" alt=\"Design for Testability - Melecs\" srcset=\"https:\/\/www.melecs.com\/wp-content\/uploads\/2022\/10\/testability-1024x682.webp 1024w, https:\/\/www.melecs.com\/wp-content\/uploads\/2022\/10\/testability-300x200.webp 300w, https:\/\/www.melecs.com\/wp-content\/uploads\/2022\/10\/testability-768x511.webp 768w, https:\/\/www.melecs.com\/wp-content\/uploads\/2022\/10\/testability.webp 1200w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-d8c84d6 elementor-widget elementor-widget-heading\" data-id=\"d8c84d6\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Melecs internal design guidelines<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-2771474 elementor-widget elementor-widget-text-editor\" data-id=\"2771474\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>In the development phase, our design guidelines cover the following parameters:<\/p>\n<ul>\n<li>optimized testing depth<\/li>\n<li>reliable adaptation<\/li>\n<li>reduction of testing time and associated costs<\/li>\n<li>testing concept design based on the expected annual number of units (1,000 units\/year vs. 1,000,000 pcs\/year)<\/li>\n<\/ul>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-2378843 elementor-widget elementor-widget-heading\" data-id=\"2378843\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Various test procedures<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-6669494 elementor-widget elementor-widget-text-editor\" data-id=\"6669494\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>In order to be able to produce your series product successfully in larger volumes and at the required quality, we test the assemblies fully before delivery. An expert team of 15 test engineers therefore test your assemblies in depth. Depending on the requirements, different test procedures and approaches are used.<\/p>\n<ul>\n<li>Optical inspection \u2013 Automatic Optical Inspection (AOI): in this test procedure, proper population of the board is ensured through an assembly-specific AOI program. This allows an assessment of the solder quality, but also reverse polarities and improperly populated assemblies.<\/li>\n<li>Electrical function test: this test is used to assess the electrical function of the assembly. Test engineers are integrated in the project team from the development phase to achieve the highest possible test coverage for serial production.<\/li>\n<li>In-Circuit Test (ICT) Component Test<\/li>\n<li>End-of-Line Tests (EOL) made specifically for the assembly<\/li>\n<li>Open IC Probes that recognize unsoldered pins in ICs<\/li>\n<li>Capacitive Probes to identify capacitors with reversed polarities<\/li>\n<li>Boundary Scan Test<\/li>\n<li>Optical LED tests<\/li>\n<\/ul>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-cf59d0e elementor-widget elementor-widget-image\" data-id=\"cf59d0e\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"image.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" width=\"800\" height=\"533\" src=\"https:\/\/www.melecs.com\/wp-content\/uploads\/2022\/10\/melecs-gmbh-design-testability-1024x682.webp\" class=\"attachment-large size-large wp-image-10068\" alt=\"Design for Testability - Melecs\" srcset=\"https:\/\/www.melecs.com\/wp-content\/uploads\/2022\/10\/melecs-gmbh-design-testability-1024x682.webp 1024w, https:\/\/www.melecs.com\/wp-content\/uploads\/2022\/10\/melecs-gmbh-design-testability-300x200.webp 300w, https:\/\/www.melecs.com\/wp-content\/uploads\/2022\/10\/melecs-gmbh-design-testability-768x511.webp 768w, https:\/\/www.melecs.com\/wp-content\/uploads\/2022\/10\/melecs-gmbh-design-testability.webp 1200w\" sizes=\"(max-width: 800px) 100vw, 800px\" \/>\t\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-a486f20 elementor-widget elementor-widget-heading\" data-id=\"a486f20\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Test Adapters<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-790a810 elementor-widget elementor-widget-text-editor\" data-id=\"790a810\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\tTest adaptors are the link between test system and the individual object to be tested, i.e. the assembly. The test adaptors used depend on the expected annual volume and include:\n<ul>\n \t<li>mechanical adaptors (procured from ATX Hardware GmbH or made in-house)<\/li>\n \t<li>pneumatic adapters<\/li>\n \t<li>2x tandem adaptors for still short cycle times and therefore low testing costs in series production<\/li>\n \t<li>Contacting across the test points or connectors specified in the layout<\/li>\n<\/ul>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-bba2c1a elementor-widget elementor-widget-heading\" data-id=\"bba2c1a\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Testing time and cost savings<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-0f49beb elementor-widget elementor-widget-text-editor\" data-id=\"0f49beb\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>To reduce testing time and thus costs for series production, high-performance programming equipment that ensures short programming times. We also used calibrated and standardized tests, e.g. Digitaltest or Reinhardt Testsysteme. This allows us to 100% guarantee traceability of the test results as well as comprehensive options for data logging.<\/p>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-8d2ee9f elementor-widget elementor-widget-heading\" data-id=\"8d2ee9f\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Typical process procedure<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-58885ad elementor-widget elementor-widget-text-editor\" data-id=\"58885ad\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p>The development of a test adaptor is ALWAYS specific to an assembly and to customer requirements.<\/p>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-52dceb79 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"52dceb79\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-no\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-29d49a0d\" data-id=\"29d49a0d\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-4263e201 elementor-widget elementor-widget-post-info\" data-id=\"4263e201\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"post-info.default\">\n\t\t\t\t<div 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Our experts are happy to help. <\/p>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-6e731223 elementor-widget elementor-widget-button\" data-id=\"6e731223\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"button.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<div class=\"elementor-button-wrapper\">\n\t\t\t\t\t<a class=\"elementor-button elementor-button-link elementor-size-sm\" href=\"https:\/\/www.melecs.com\/en\/contact\">\n\t\t\t\t\t\t<span class=\"elementor-button-content-wrapper\">\n\t\t\t\t\t\t\t\t\t<span class=\"elementor-button-text\">CONTACT US<\/span>\n\t\t\t\t\t<\/span>\n\t\t\t\t\t<\/a>\n\t\t\t\t<\/div>\n\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t<div class=\"elementor-column elementor-col-50 elementor-top-column elementor-element elementor-element-33a0ceed\" data-id=\"33a0ceed\" data-element_type=\"column\" data-e-type=\"column\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-1e4375cb elementor-hidden-desktop elementor-hidden-tablet_extra elementor-widget elementor-widget-spacer\" data-id=\"1e4375cb\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"spacer.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<div class=\"elementor-spacer\">\n\t\t\t<div class=\"elementor-spacer-inner\"><\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Design for Testability Design techniques to integrate testability features in a hardware product design. The term Design for Testability (DFT) refers to design techniques that integrate testability features into a hardware product design. The aim of the various test procedures is to rule out manufacturing defects and thus ensure the correct function and quality of [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":10064,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"footnotes":""},"categories":[68,16],"tags":[],"class_list":["post-14423","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-news","category-sin-categorizar"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v27.7 - https:\/\/yoast.com\/product\/yoast-seo-wordpress\/ -->\n<title>Design for Testability (DFT) - Melecs<\/title>\n<meta name=\"description\" content=\"Design techniques to integrate testability features in a hardware product design. 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